YAO Yuanzhao

Affiliation

Institute of Pure and Applied Sciences

Official title

Specially Appointed Assistant Professor

Degree


2018-04	博士(工学)	筑波大学

Articles

Comparison of SE emission from alumina and SUS spheres using low vacuum SEM
Yuanzhao Yao; 早田康成; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy, 2025-06-09
Mid-IR Electromagnetic Topological Edge Modes: Design, Fabrication, and Polarization States Confirmed by High-Angle-Resolution Reflection Spectroscopy
YAO Yuanzhao; Begum Afshan; Ikeda Naoki; Takeda Yoshi...
J. Phys. Soc. Jpn./94/p.101004, 2025-06-24
Improving surface flashover voltages of alumina insulators by applying titanium dioxide coatings
Ogura Akio; Katagiri Souichi; Yuanzhao Yao; Nogi Hiro...
IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), 2025-03
Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detector
Yuto Yanagihara; Yuanzhao Yao; Hayata Yamamoto; 関口隆史
Microscopy, 2025-07
一方通行の光導波路をナノ加工したシリコンで実現
姚遠昭; 迫田和彰
固体物理/59(7)/pp.1-12, 2024-07
Mid-IR Dirac-cone dispersion relation materialized in SOI photonic crystal slabs
YAO Yuanzhao; Ikeda Naoki; Kuroda Takashi; Mano Takaa...
Optics Express/28/pp.4194-4203, 2020-01
Angle-resolved reflection spectra of Dirac cones in triangular-lattice photonic crystal slabs
YAO Yuanzhao; Kuroda Takashi; Ikeda Naoki; Mano Takaa...
Optics Express/28/pp.21601-21615, 2020-06
Improved power and far-field pattern of surface-emitting quantum cascade lasers with strain compensation to operate at 4.3 um
YAO Yuanzhao; Ikeda Naoki; Chalimah Siti; Kuroda Takashi
Japanese Journal of Applied Physics/61/p.052001, 2022-04
Observation of Two-dimensional Isotropic Double Dirac Cones in the Electromagnetic Dispersion Relation
Begum Afshan; YAO Yuanzhao; Kuroda Takashi; Watanabe; ...
Journal of The Physical Society of Japan/91/p.084401, 2022-06
Topological band gaps and edge modes materialized by symmetric solicon-on-insulator photonic crystal slabs in the mid-IR range
Begum Afshan; YAO Yuanzhao
Physical Review A/107/p.043507, 2023-04
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
Uzuhashi Jun; Yao Yuanzhao; Ohkubo Tadakatsu; Sekiguch...
MICROSCOPY/Epub, 2025-02-03
Design and Characteristics of Photonic Crystal Resonators for Surface-Emitting Quantum Cascade Lasers
Sakoda Kazuaki; Yao Yuanzhao; Ikeda Naoki; Sugimoto Y...
PHOTONICS/11(11), 2024-11
Acceptance characterization of electron detector in SEM using stainless steel sphere
Sekiguchi Takashi; Yao Yuanzhao; Sonoda Ryosuke; Sohda...
MICROSCOPY/Epub, 2024-10-28
Design and Observation of Topological Band Gaps and Edge Modes of SOI Photonic Crystal Slabs in the Mid-Infrared Range
Begum Afshan; Yao Yuanzhao; Kuroda Takashi; Takeda Yo...
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN/92(11), 2023-11-15

Conference, etc.

TiO2薄膜コーティングしたアルミナ表面の帯電評価
小倉暁雄; 片桐創一; 姚遠昭; 野木広光; 蓮沼隆
2024年第71回応用物理学会春季学術講演会/2024-03-22
金属酸化物薄膜を有したアルミナ表面の帯電評価
小倉暁雄; 片桐創一; 姚遠昭; 野木広; 蓮沼隆
令和6年電気学会全国大会/2024-03-14
TiN膜付アルミナ碍子の耐電圧特性の向上に関する研究
角谷凌太郎; 小倉暁雄; 野木広光; 姚遠昭; 片桐創一
2023年第70回応用物理学会春季学術講演会/2023-03-15
Improving surface flashover voltages of alumina insulators by applying titanium dioxide coatings
OGURA Akio; Katagiri Souichi; Yuanzhao Yao; Nogi Hiro...
IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 2024/2024-10-06
Secondary electron detectors for low vacuum SEM (comparison of UVD and ET detectors)
Yuanzhao Yao; 園田涼輔; 早田康成; 関口隆史
72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
Development of High Pass Electron Detector for Low-energy Backscattered electron Detector in SEM
栁原悠人; Yao Yuanzhao; 山本隼大; SEKIGUCHI Takashi
Microscopy and Microanalysis 2025/2025-07-27--2025-07-31
Backscattered Electron Detector Using Microchannel Plate
栁原悠人; Yuanzhao Yao; 関口隆史
72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
Physical Information in Low Energy Backscattered Electron Image
関口隆史; Yuanzhao Yao; 松石晃弥; 栁原悠人
72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
Development of SE/BSE detector arranged in a dodecahedron
栁原悠人; 熊谷和博; Yuanzhao Yao; 山本隼大; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Energy resolution of Al-Bi metal using MCP detector
澁谷宗平; Yuanzhao Yao; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Energy resolved secondary electron imaging of B-doped diamond films
樋口　慶; Yuanzhao Yao; 熊谷和博; 宋翰聞; 神田久生; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Energy resolution of Al-Bi metal using MCP detector
松石晃弥; 栁原悠人; Yuanzhao Yao; 高森　晋; 木村　隆; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Comparison of SE emission from alumina and SUS spheres using low vacuum SEM
Yuanzhao Yao; 早田康成; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Development of thickness-controlled TEM sample preparation by FIB-SEM
埋橋淳; 大久保忠勝; Yuanzhao Yao; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Development and Application of High Pass Electron Detector in Low Accelerated Voltage SE
関口隆史; Yuanzhao Yao
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Development and Application of High Pass Electron Detector in Low Accelerated Voltage SE
栁原悠人; Yuanzhao Yao; 山本隼大; 関口隆史
81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
Characteristics of backscattered electron images taken by MCP detector
栁原悠人; Yuanzhao Yao; 関口隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
SEM observation of GaN hexagonal prism crystal using concentric fountain SE detector
樋口　慶; Yuanzhao Yao; 関口隆史; 熊谷和博
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
Anomalous backscattered electron emission from grain boundaries in multi element alloy
松石晃弥; Yuanzhao Yao; 高森　晋; 木村　隆; 関口隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
Characteristics of secondary electron emission from insulators analyzed by Al2O3 sphere image
Yuanzhao Yao; 早田康成; 関口隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
Characterization of secondary electron detector（UVD）in low vacuum SEM
Yuanzhao Yao; 園田涼輔; 早田康成; 関口隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
低真空SEMを用いた絶縁体球および孔構造の観察
姚遠昭
日本顕微鏡学会SEMの物理学分科会討論会/2025-02-14--2025-02-15
低真空SE検出器（UVD）のアクセプタンス評価ーUVDとET検出器の違い
姚遠昭
日本顕微鏡学会SEMの物理学分科会討論会/2023-12-10--2023-12-11
Characterization of secondary electron detector in normal and low vacuum SEM
YAO Yuanzhao; Sonoda Ryosuke; 早田康成; 関口隆史
The 14th International Vacuum Electron Sources Conference/2023-09-25--2023-09-28

(Last updated: 2025-08-20)