SHIGEKAWA Hidemi

Researcher's full information

Articles

• Tunneling spectroscopy and manipulation of a single C2H2 molecule on a Cu(111) surface
  Konishi Y; Sainoo Y; Kanazawa K; Yoshida S; Taninaka A; T...
  PHYSICAL REVIEW B/71(19)/pp.0-0, 2005-05
• Atomic force microscopy on imogolite, aluminosilicate nanotube, adsorbed on Au(111) surface
  Ohrai Y; Gozu T; Yoshida S; Takeuchi O; Iijima S; Shigeka...
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS/44(7B:Part 1 Sp. Iss. SI)/pp.5397-5399, 2005-07
  
  CiNii
• Analysis of time-resolved tunnel current signal in sub-picosecond range observed by shaken-pulse-pair-excited scanning tunneling miscroscopy
  Takeuchi O; Aoyama M; Shigekawa H
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS/44(7B:Part 1 Sp. Iss. SI)/pp.5354-5357, 2005-07
  
  CiNii
• Excitation of molecular vibrational modes with inelastic scanning tunneling microscopy processes: Examination through action spectra of cis-2-butene on Pd(110)
  Sainoo Y; Kim Y; Okawa T; Komeda T; Shigekawa H; Kawai M
  PHYSICAL REVIEW LETTERS/95(24)/pp.0-0, 2005-12
• Development of femtosecond time-resolved scanning tunneling microscopy for nanoscale science and technology
  Shigekawa H; Takeuchi O; Aoyama M
  SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS/6(6)/pp.582-588, 2005-09
• Electronic structures of individual poly(3-hexylthiophene) nanowires on hydrogen-terminated Si(100) surfaces
  Terada Y; Shigekawa H; Suwa Y; Heike S; Fujimori M; Hashi...
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS/45(3B)/pp.1956-1961, 2006-03
• Nonlinear dependences in pulse-pair-excited scanning tunneling microscopy
  Takeuchi O; Aoyama M; Kondo H; Taninaka A; Terada Y; Shig...
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS/45(3B)/pp.1926-1930, 2006-03
• Long wavelength InAs self-assembled quantum dots embedded in GaNAs strain-compensating layers
  Oshima R; Hashimoto T; Shigekawa H; Okada Y
  PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES/32(1-2)/pp.77-80, 2006-05
• Single molecular anatomy of solvophobic effects in host-guest interactions based on surface tension using atomic force microscopy
  Yasuda S; Suzuki I; Shinohara K; Shigekawa H
  PHYSICAL REVIEW LETTERS/96(22)/pp.0-0, 2006-06
• Bond fluctuation of S/Se anchoring observed in single-molecule conductance measurements using the point contact method with scanning tunneling microscopy
  Yasuda Satoshi; Yoshida Shoji; Sasaki Jiro; Okutsu Yoshi...
  JOURNAL OF THE AMERICAN CHEMICAL SOCIETY/128(24)/pp.7746-7747, 2006-06
• Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe
  Takeuchi Osamu; Miyakoshi Takaaki; Taninaka Atsushi; Tana...
  JOURNAL OF APPLIED PHYSICS/100(7)/pp.0-0, 2006-10
• Multiple stacking of self-assembled InAs quantum dots embedded by GaNAs strain compensating layers
  Oshima Ryuji; Hashimoto Takayuki; Shigekawa Hidemi; Okada...
  JOURNAL OF APPLIED PHYSICS/100(8)/pp.0-0, 2006-10