TAKEUCHI Osamu
- Conference, etc.
- 多探針ＳＴＭによる不均一物質中の電位分布計測
甲山 智規; 茂木 裕幸; 三成 剛生; 武内 修; 重川 秀実
日本顕微鏡学会 第７０回記念学術講演会 -顕微鏡学に来し方行く末-/2014-5-11--2014-5-13 - 多探針STMによるSTMポテンショメトリー
甲山 智規; 茂木 裕幸; 武内 修; 重川 秀実
ナノ学会第11回大会－異分野研究者間の交流を目指して－/2013-6-6--2013-6-8 - 多探針STM用走査トンネルポテンショメトリーの開発
甲山 智規; 茂木 裕幸; BOLOTOV Leonid; 三成 剛生; 武内 修; 重川 秀実
第74回応用物理学会秋季学術講演会/2013-9-16--2013-9-20 - 多探針 STM による局所電位測定
甲山 智規; 茂木 裕幸; 三成 剛生; 武内 修; 重川 秀実
第54回真空に関する連合講演会/2013-11-26--2013-11-28 - Local resistivity measurement by multiprobe scanning tunneling potentiometry
Mogi Hiroyuki; Bamba Takafumi; Taninaka Atsushi; Yoshida ...
2018 International Conference on Nanoscience + Technology (ICN+T 2018)/2018-07-22--2018-07-27 - Optical Pump-probe Multiprobe Scanning Tunneling Microscopy on Transient Carrier Dynamics in Semiconductors
Wang Zi-han; Mogi Hiroyuki; Yoon Cheul hyun; Yoshida Sho...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Local Conductivity Measurement on a High Quality Graphite by Multi-probe Scanning Tunneling Potentiometry
Mogi Hiroyuki; Kuroda Ibuki; Kawashima Yuki; Murakami Mu...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Two-probe Measurement of CVD grown WSe2 on SiO2/Si by Using Conductive AFM Cantilevers
Kuroda Ibuki; Mogi Hiroyuki; Takaguchi Yuhei; Miyata Yas...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Transient Carrier Dynamics of WSe2 monolayer Observed by Multi-probe Optical Pump-probe STM
Mogi Hiroyuki; Wang Zi-han; Takaguchi Yuhei; Bamba Takaf...
The 8th International Symposium on Surface Science (ISSS-8)/2017-10-22--2017-10-26 - Detecting Ultrafast Carrier Dynamics of WSe2 monolayer by a Multi-probe Optical Pump-probe STM
Mogi Hiroyuki; Wang Zi-han; Takaguchi Yuhei; Bamba Takaf...
25th International Colloquium on Scanning Probe Microscopy (ICSPM25)/2017-12-07--2017-12-09 - Development of non-destructive local electrical conductivity measurement by using a multi-probe STM
Bamba Takafumi; Mogi Hiroyuki; Kuroda Ibuki; Taninaka At...
25th International Colloquium on Scanning Probe Microscopy (ICSPM25)/2017-12-07--2017-12-09 - Formation of MoS2 nanowire in Mo1-xWxS2 alloy monolayer studied by STM
Mogi Hiroyuki; Yoshida Shoji; Kobayashi Yu; Miyata Yasum...
24th International Colloquium on Scanning Probe Microscopy (ICSPM24)/2016-12-14--2016-12-16 - Transient Dynamics of Low-dimensional TMDs Observed by Multi-probe Optical Pump-probe Scanning Tunneling Microscopy
Mogi Hiroyuki; Wang Zi-han; Bamba Takafumi; Yoshida Shoj...
24th International Colloquium on Scanning Probe Microscopy (ICSPM24) - Transient Dynamics of Low-dimensional TMDs Observed by Multi-probe Optical Pump-probe Scanning Tunneling Microscopy
Wang Zi-han; Mogi Hiroyuki; Bamba Takafumi; Yoshida Shoj...
24th International Colloquium on Scanning Probe Microscopy (ICSPM24)/2016-12-14--2016-12-16 - Scanning tunneling potentiometry on FIB-deposited PtC pattern by using multi-probe STM
Mogi Hiroyuki; Bamba Takafumi; Yoshida Shoji; Takeuchi O...
24th International Colloquium on Scanning Probe Microscopy (ICSPM24) - Scanning tunneling potentiometry on FIB-deposited PtC pattern by using multi-probe STM
Bamba Takafumi; Mogi Hiroyuki; Yoshida Shoji; Takeuchi O...
24th International Colloquium on Scanning Probe Microscopy (ICSPM24)/2016-12-14--2016-12-16 - Atomic scale STM/STS analysis on transition metal dichalcogenide heterostructures
Mogi Hiroyuki; Sakurada Ryuji; Kobayashi Yu; Miyata Yasu...
23rd International Colloquium on Scanning Probe Microscopy (ICSPM23) - Atomic scale STM/STS analysis on transition metal dichalcogenide heterostructures
Sakurada Ryuji; Yoshida Shoji; Taninaka Atsushi; Kobayash...
23rd International Colloquium on Scanning Probe Microscopy (ICSPM23)/2015-12-10--2015-12-12 - Analysis of compositional variation in Mo1-xWxS2 single layer heterostructure using STM
Mogi Hiroyuki; Yoshida Shoji; Kobayashi Yu; Miyata Yasum...
23rd International Colloquium on Scanning Probe Microscopy (ICSPM23)/2015-12-10--2015-12-12 - Analysis of compositional variation in Mo1-xWxS2 single layer heterostructure using STM
Mogi Hiroyuki; Yoshida Shoji; Kobayashi Yu; Miyata Yasum...
23rd International Colloquium on Scanning Probe Microscopy (ICSPM23)/2015-12-10--2015-12-12 - Scanning tunneling microscope potentiometry on single layer graphene flakes
Koyama Tomoki; Mogi Hiroyuki; Yoshimura Masamichi; Takeuc...
22nd International Colloquium on Scanning Probe Microscopy (ICSPM22)/2013-11-04--2013-11-08 - Scanning tunneling microscope potentiometry on single layer graphene flakes
Koyama Tomoki; Mogi Hiroyuki; Yoshimura Masamichi; Takeuc...
22nd International Colloquium on Scanning Probe Microscopy (ICSPM22)/2014-12-11--2014-12-13 - Scanning Tunneling Potentiometry/Spectroscopy with Multi-Probe STM
Koyama Tomoki; Mogi Hiroyuki; Minari Takeo; Takeuchi Osa...
12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12)/ 21th International colloquium on Scanning Probe Microscopy (ICSPM21)/2013-11-4--2013-11-8 - Scanning Tunneling Potentiometry/Spectroscopy with Multi-Probe STM
Mogi Hiroyuki; Koyama Tomoki; Minari Takeo; Takeuchi Osa...
12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12)/ 21th International colloquium on Scanning Probe Microscopy (ICSPM21)/2013-11-04--2013-11-08 - Scanning Tunneling Potentiometry/Spectroscopy with Multi-Probe STM
Mogi Hiroyuki; Koyama Tomoki; Minari Takeo; Takeuchi Osa...
21th International colloquium on Scanning Probe Microscopy (ICSPM21)/2013-11-04--2013-11-08 - more...
- 多探針ＳＴＭによる不均一物質中の電位分布計測