TAKEUCHI Osamu
- Conference, etc.
- Two-probe Measurement of CVD grown WSe2 on SiO2/Si by Using Conductive AFM Cantilevers
Kuroda Ibuki; Mogi Hiroyuki; Takaguchi Yuhei; Miyata Yas...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Direct characterization of terahertz near field waveform around metal nanotip by multiphoton photoemission
Shinomiya Yoshiyasu; Yoshida Shoji; Ueno Hiroki; Nagai S...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Influence of Extracellular Stress on Cancer Cell Studied by Atomic Force Microscopy
Saito Kotaro; Taninaka Atsushi; Ugajin Shunta; Hayaki Ei...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Band Modulation Appearance on TMDC Lateral Heterojunctions
Murase Kota; Kobayashi Yu; Yoshida Shoji; Takeuchi Osamu...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Surface Impurity Affected Electron Spin Dynamics in GaAs Probed by Optical Pump-probe Scanning Tunneling Microscopy
Wang Z.H.; C.H.Yoon; Yoshida S.; Takeuchi O.; Ohno Y.; Shi...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Conformational Effect in Single Molecular Junction for Short-Distance Electrodes studied by Molecular Dynamics Simulation and Dynamic Probe Method
Taninaka Atsushi; Yoshida Shoji; Sugita Yoshihiro; Takeuc...
14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) & 26th International Colloquium on Scanning Probe Microscopy (ICSPM26)/2018-10-21--2018-10-25 - Nanoscale dynamics probed by laser-combined scanning tunneling microscopy
Shigekawa Hidemi; Yoshida Shoji; Takeuchi Osamu; Aoyama ...
7th International Conference on Nano-Molecular Electronics (ICNME2006) - Nanoscale mapping of built-in potential in GaAs p-n junction using light-modulated scanning tunneling microscopy
Yoshida Shoji; Kanitani Yuya; Oshima Ryuji; Okada Yoshit...
15th International Colloquium on Scanning Probe Microscopy (ICSPM 15)/2007-12-06--2007-12-08
- Two-probe Measurement of CVD grown WSe2 on SiO2/Si by Using Conductive AFM Cantilevers