KOBAYASHI Nobuhiko
- Articles
- Theoretical Study of Current and Barrier Height between Aluminum Tip and Silicon Surface in Scanning Tunneling Microscopy
Nobuhiko Kobayashi; Kenji Hirose; and Masaru Tsukada
Japanese Journal of Applied Physics/35/p.3710-3713, 1996-01 - First-principles calculation of electronic states under field and current and its application to atom manipulation
Kenji Hirose; Osamu Sugino; Nobuhiko Kobayashi; and Masa...
Proceedings of International Workshop on Atomically Controlled Surface Processes/p.13-16, 1995-01 - Structural Phase Transitions at Clean and Metal-coverd Si(111) Surfaces Investigated by RHEED Spot Analysis
Shuji Hasegawa; Yasuyoshi Nagai; Toshio Oonishi; Nobuhiko...
Phase Transitions/53/p.87-114, 1995-01
- Theoretical Study of Current and Barrier Height between Aluminum Tip and Silicon Surface in Scanning Tunneling Microscopy