HASE Muneaki

Researcher's full information

Conference, etc.

• In situ spectroscopic measurement of defect formation in SiO2 induced by femtosecond laser irradiation
  Fukata N; Yamamoto Y; Murakami K; Hase M; Kitajima M
  22nd International Conference on Defects in Semiconductors (ICDS-22)/2003-07-28--2003-08-01