YANO Hiroshi
- Articles
- Investigation of Maximum Junction Temperature for 4H-SiC MOSFET during Unclamped Inductive Switching Test
安 俊傑; 生井 正輝; 岡本 大; 矢野 裕司; 只野 博; 岩室 憲幸
IEEJ Transaction of EIS/137(2)/pp.216-221, 2017 - 相補型インバータ向け縦型SiC-pMOSFETの検討
奥田 一真; 磯部 高範; 矢野 裕司; 岩室 憲幸; 只野 博
Journal of the Japan Institute of Power Electronics/40/pp.238-238, 2015-03
- Investigation of Maximum Junction Temperature for 4H-SiC MOSFET during Unclamped Inductive Switching Test