SEKIGUCHI Takashi
- Conference, etc.
- Characteristics of diagonal SE/BSE detection in SEM
関口 隆史
日本顕微鏡学会第79回学術講演会/2023-06-26--2023-06-28 - Micellimaging using low-vacuum SEM
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Observation of Bacillus subtils using various detectors
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Relationship between charging phenomena and secondary electron emission in scanning electron microscopy
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Evaluation of the effect of sample charging about the reflected electron image - Halation
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Energy and Direction Resolved Secondary Electron Imaging Using Fountain Detector
Sekigushi Takashi
International Symposium on Practical Surface Analysis (PSA-19)/2019-11-08 - Low Vacuum Scanning Electron Microscopy for Widegap Semiconductors and Insulating Materials
Sekigushi Takashi
International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)/2019-09-08--2019-09-12 - GaPにおけるコヒーレントフォノンのGa+集束イオンビーム照射効果
市川 卓人; 関口隆史; 齊藤 雄太; 長谷 宗明
第６７回応用物理学会春季学術講演会/2020-03-12--2020-03-15 - Secondary electron spectroscopy for imaging semiconductor materials
Agemura Toshihide; Sekiguchi Takashi
International Symposium on Semiconductor Manufacturing (ISSM)/2018-12-10--2018-12-11
- Characteristics of diagonal SE/BSE detection in SEM