SEKIGUCHI Takashi
- Conference, etc.
- Characteristics of backscattered electron images taken by MCP detector
栁原悠人; Yuanzhao Yao; 関口 隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05 - SEM observation of GaN hexagonal prism crystal using concentric fountain SE detector
樋口 慶; Yuanzhao Yao; 関口 隆史; 熊谷和博
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05 - Anomalous backscattered electron emission from grain boundaries in multi element alloy
松石晃弥; Yuanzhao Yao; 高森 晋; 木村 隆; 関口 隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05 - Characteristics of secondary electron emission from insulators analyzed by Al2O3 sphere image
Yuanzhao Yao; 早田康成; 関口 隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05 - Characterization of secondary electron detector（UVD）in low vacuum SEM
Yuanzhao Yao; 園田涼輔; 早田康成; 関口 隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05 - Characteristics of various electron detectors in SEM and the image information
関口 隆史
80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05 - Characteristics of diagonal SE/BSE detection in SEM
関口 隆史
The 60th SASJ Meeting/2023-06-29--2023-06-30 - Evaluation of the detection property of an angle selective fountain electron detector
関口 隆史; 熊谷和博
DRIP XIX (The 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors)/2022-08-29--2022-09-01 - Cathodoluminescence study of 3C-SiC layer grown on 4H-SiC substrate
Jun Chen; Sazawa Hiroyuki; Wei Yi; Sekigushi Takashi
DRIP XIX (The 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors)/2022-08-29--2022-09-01 - 線形代数とSEM／電子検出器のアクセプタンスについて
関口 隆史
第 60 回表面分析研究会/2023-06-29--2023-06-30 - Microscopic world of low-vacuum SEM
関口 隆史
日本表面真空学会真空技術部会/2023-06-07--2023-06-07 - Characterization of surface bumps in SiC using concentric fountain SE detector
関口 隆史; 小川創馬; 熊谷和博
日本顕微鏡学会第79回学術講演会/2023-06-26--2023-06-28 - Characteristics of diagonal SE/BSE detection in SEM
関口 隆史
日本顕微鏡学会第79回学術講演会/2023-06-26--2023-06-28 - Micellimaging using low-vacuum SEM
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Observation of Bacillus subtils using various detectors
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Relationship between charging phenomena and secondary electron emission in scanning electron microscopy
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Evaluation of the effect of sample charging about the reflected electron image - Halation
関口 隆史
日本顕微鏡学会学術講演会/2021-06-14--2021-06-16 - Energy and Direction Resolved Secondary Electron Imaging Using Fountain Detector
Sekigushi Takashi
International Symposium on Practical Surface Analysis (PSA-19)/2019-11-08 - Low Vacuum Scanning Electron Microscopy for Widegap Semiconductors and Insulating Materials
Sekigushi Takashi
International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)/2019-09-08--2019-09-12 - GaPにおけるコヒーレントフォノンのGa+集束イオンビーム照射効果
市川 卓人; 関口隆史; 齊藤 雄太; 長谷 宗明
第６７回応用物理学会春季学術講演会/2020-03-12--2020-03-15 - Secondary electron spectroscopy for imaging semiconductor materials
Agemura Toshihide; Sekiguchi Takashi
International Symposium on Semiconductor Manufacturing (ISSM)/2018-12-10--2018-12-11
- Characteristics of backscattered electron images taken by MCP detector