NONAKA Hidehiko

Researcher's full information

Articles
  • In-situ measurement of gas composition changes in radio frequency plasmas using a quartz sensor
    Suzuki Atsushi; Nonaka Hidehiko
    Review of Scientific Instruments/80(9)/pp.95109-1-95109-1, 2009-09
  • Advantage of highly concentrated (>90%) ozone for chemical vapor deposition SiO2 grown under 200℃ using hexamethyldisilazane and ultraviolet light excited ozone
    Kameda Naoto; Nishiguchi Tetsuya; Morikawa Yoshiki; Kekur...
    Japanese Journal of Applied Physics/48(5)/pp.05DB01-1-05DB01-4, 2009-03
  • Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams
    Fujiwara Yukio; Kondou Kouji; Watanabe Kouoji; Nonaka Hi...
    Applied Surface Science/255(4)/pp.1338-1340, 2008-12
  • Cluster SIMS using metal cluster complex ions
    Fujiwara Yukio; Kondou Kouji; Teranishi Yoshikazu; Watana...
    Applied Surface Science/255(4)/pp.916-921, 2008-12
  • Measurement of a wide range of hydrogen concentration with rapid response using dual pressure gauges
    Suzuki Atsushi; Nonaka Hidehiko
    International Journal of Hydrogen Energy/33(21)/pp.6385-6392, 2008-11
  • Non-Destructive and Discriminating Identification of Illegal Drugs by Transient Absorption Spectroscopy in the Visible and Near-IR Wavelength Range
    Sato Chie; Furube Akihiro; Katoh Ryuzi; Nonaka Hidehiko; ...
    Japanese Journal of Applied Physics/47(11)/pp.8583-8589, 2008-11
  • Photochemical Reaction of Ozone and 1,1,1,3,3,3-Hexamethyldisilazane: Analysis of the Gas Reaction between Precursors in a Photochemical Vapor Deposition Process
    Nakamura Ken; Nonaka Hidehiko; Kameda Naoto; Nishiguchi ...
    Japanese Journal of Applied Physics/47(9)/pp.7349-7355, 2008-09
  • Multiphoton ionization of metal cluster complexes Os3(CO)12 and Ir4(CO)12: Determination of the ionization energy and coordination energy of the complex ions
    Nakanaga Taisuke; Nagai Hidekazu; Suzuki Atsushi; Fujiwar...
    Journal of Photochemistry and Photobiology A-Chemistry/197(2/3)/pp.266-272, 2008-06
  • Measured Gas Concentrations and Flow Properties in SiH4 - H2 Mixtures
    Suzuki Atsushi; Nonaka Hidehiko
    Japanese Journal of Applied Physics/47(5)/pp.3661-3665, 2008-05
  • Dissociative ionization of a large molecule studied by intense phase-controlled laser fields
    Ohmura Hideki; Saito Naoaki; Nonaka Hidehiko; Ichimura S...
    Physical Review A/77(5)/pp.053405-1-053405-5, 2008-05
  • HOPG surface irradiated by metal cluster complex ions
    Teranishi Yoshikazu; Kondou Kouji; Mizota Takeshi; Fujiwa...
    Materials Science And Engineering B/148/pp.132-135, 2008-02
  • Secondary-Ion-Mass-Spectrometry Depth Profiling of Ultra-Shallow Boron Delta Layers in Silicon with the Massive Molecular Ion Beam of Ir4(CO)7+
    Fujiwara Yukio; Kondou Kouji; Watanabe Kouoji; Nonaka Hi...
    Japanese Journal of Applied Physics/46(11)/pp.7599-7601, 2007-11
  • Characteristics of altered layers formed by sputtering with cluster ions containing diverse elements with large mass differences
    Fujiwara Yukio; Kondou Kouji; Nonaka Hidehiko; Saito Nao...
    Journal of Applied Physics/102(7)/pp.73509-1-73509-7, 2007-11
  • Beam-induced nanoscale ripple formation on silicon with the metal-cluster-complex ion of Ir4(CO)7+
    Fujiwara Yukio; Kondou Kouji; Watanabe Kouji; Nonaka Hid...
    Japanese Journal of Applied Physics/46(35)/pp.L854-L857, 2007-09
  • High quality gate dielectric film on poly-silicon at room temperature by UV light excited ozone
    Kameda Naoto; Nishiguchi Tetsuya; Morikawa Yoshiki; Kekur...
    Journal of the Electrochemical Society/154(9)/pp.H769-H772, 2007-09
  • Observation of a sputtered Si surface by an ion irradiation system using a proto-type compact cluster ion source
    Teranishi Yoshikazu; Kondou Kouji; Mizota Takeshi; Fujiwa...
    Surface and Coatings Technology/201(19/20)/pp.8641-8645, 2007-08
  • Rapid Oxidation of Silicon Using UV-Light Irradiation in Low-Pressure, Highly Concentrated Ozone Gas below 300 ℃
    Nishiguchi Tetsuya; Saitoh Shigeru; Kameda Naoto; Morikaw...
    Japanese Journal of Applied Physics/46(5A)/pp.2835-2839, 2007-05
  • Irradiation characteristics of metal-cluster-complex ions containing diverse multi-elements with large mass differences
    Fujiwara Yukio; Kondou Kouji; Teranishi Yoshikazu; Nonaka...
    Nuclear Instruments and Methods in Physics Research Section B/257/pp.653-657, 2007-04
  • Sputtered Si surface irradiated by metal cluster complex ions such as Os3(CO)12 and Ir4(CO)12
    Teranishi Yoshikazu; Kondou Kouji; Fujiwara Yukio; Nonaka...
    Nuclear Instruments and Methods in Physics Research Section B/257/pp.670-676, 2007-04
  • SIMS depth profile study using of metal cluster complex ion bombardment
    Tomita Mitsuhiro; Kinno Teruyuki; Koike Mitsuo; Tanaka H...
    Nuclear Instruments and Methods in Physics Research Section B/258/pp.242-245, 2007-04
  • Reaction analysis of initial oxidation of silicon by UV-light-excited ozone and the application to rapid and uniform SiO2 film growth
    Tosaka Aki; Nishiguchi Tetsuya; Nonaka Hidehiko; Ichimura...
    Journal of Applied Physics/101(3)/pp.034909-1-034909-7, 2007-02
  • Characteristics of a metal-cluster-complex ion beam of Os3(CO)n+ (n=7 or 8) for low damage sputtering
    Fujiwara Yukio; Kondou Kouji; Teranishi Yoshikazu; Nonaka...
    Surface and Interface Analysis/38(12/13)/pp.1539-1544, 2006-12
  • Secondary Ion Mass Spectrometry of organic thin films using a metal-cluster- complex ion source
    Fujiwara Yukio; Kondou Kouji; Nonaka Hidehiko; Saito Nao...
    Japanese Journal of Applied Physics/45(36B)/pp.L987-L990, 2006-09
  • Ion-beam characteristics of the metal cluster complex of Ir4(CO)12
    Fujiwara Yukio; Kondou Kouji; Teranishi Yoshikazu; Nonaka...
    Journal of Applied Physics/100(4)/pp.043305-1-043305-9, 2006-08
  • Depth Resolution Improvement in Secondary Ion Mass Spectrometry Analysis using Metal Cluster Complex Ion Bombardment
    Tomita Mitsuhiro; Kinno Teruyuki; Koike Mitsuo; Tanaka H...
    Applied Physics Letters/89(5)/pp.053123-1-053123-3, 2006-07
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