SEKIGUCHI Takashi

Affiliation
Institute of Pure and Applied Sciences
Official title
Specially Appointed Professor
Email
/D6<:8F49:]E2<2D9:]7ATc_F]EDF<F32]24];A
Research keywords
Scanning Electron Microscopy, Semiconductor, Defects
Secondary Electron Detector
Degree
1996-03Dr. of ScienceTohoku Univ.
Academic societies
1988-04 -- (current)The Japan Society of Applied Physics
1998-04 -- (current)The Japanese Society of Microscopy
Honors & Awards
2017-06瀬藤賞（顕微鏡学会賞）Cathodoluminescence and EBIC Characterization of Semiconducting Materials
Articles
Conference, etc.
  • 坑水からのMn酸化菌Sarocladium strictumの分離と培養特性
    盧 星燕; 山路 恵子; 谷内 美月; 松代雄太; 梶原海斗; 関口隆史; 川原里紗; 小原義之
    資源・素材学会2025年度秋季大会/2025-09-02--2025-09-04
  • SEMの二次電子・反射電子の分類とそこに含まれる物理情報の整理
    関口隆史; 姚 遠昭
    第73回応用物理学会春季学術講演会/2026-03-15--2026-03-18
  • 低真空 SEM を用いた TGV 孔亀裂の観察
    姚 遠昭; 澁谷宗平; Kim Minjae; 馮 ウェイ; 竹井 裕介; 関口 隆史
    第73回応用物理学会春季学術講演会/2026-03-15--2026-03-18
  • 低真空二次電子検出器を用いた孔構造のSEM観察
    姚 遠昭; 澁谷宗平; 関口隆史
    第８６回応用物理学会秋季学術講演会/2025-09-08--2025-09-10
  • Comparison of SE emission from alumina and SUS spheres using low vacuum SEM
    Yuanzhao Yao; 早田康成; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09
  • 走査電子顕微鏡における帯電現象と二次電子放出の関係
    田上 就也; 早田 康成; 関口 隆史
    日本顕微鏡学会, SEMの物理学分科会研究会/2020-11-13
  • 走査電子顕微鏡における帯電現象と二次電子放出の関係
    田上 就也; 早田 康成; 関口 隆史
    日本顕微鏡学会, 日本顕微鏡学会第77回学術講演会/2021-06-14
  • SEMを使った明視野・暗視野STEM法によるコリネ菌の観察
    関口 隆史; 鈴木 千紘; 早田 康成
    顕微鏡学会/2022-05-11--2022-05-13
  • 試料帯電が反射電子像に与える影響の評価－ハレーション
    園田 涼輔; 早田 康成; 関口 隆史
    日本顕微鏡学会, 日本顕微鏡学会第77回学術講演会/2021-06-14
  • SEMにおける斜出射二次電子・反射電子検出の特徴
    関口 隆史; 早田 康成; 園田 涼輔; 姚 遠昭
    顕微鏡学会/2023-06-29--2023-06-30
  • 暗視野STEM法によるコリネ菌中のFe分布の観察
    小嶋俊平; 早田 康成; 関口隆史
    顕微鏡学会/2023-06-29--2023-06-30
  • Characterization of secondary electron detector in normal and low vacuum SEM
    YAO Yuanzhao; Sonoda Ryosuke; 早田康成; 関口隆史
    The 14th International Vacuum Electron Sources Conference/2023-09-25--2023-09-28
  • Secondary electron detectors for low vacuum SEM (comparison of UVD and ET detectors)
    Yuanzhao Yao; 園田涼輔; 早田康成; 関口 隆史
    72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
  • Development of High Pass Electron Detector for Low-energy Backscattered electron Detector in SEM
    栁原悠人; Yao Yuanzhao; 山本隼大; SEKIGUCHI Takashi
    Microscopy and Microanalysis 2025/2025-07-27--2025-07-31
  • Backscattered Electron Detector Using Microchannel Plate
    栁原悠人; Yuanzhao Yao; 関口 隆史
    72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
  • Physical Information in Low Energy Backscattered Electron Image
    関口 隆史; Yuanzhao Yao; 松石晃弥; 栁原悠人
    72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
  • Development of SE/BSE detector arranged in a dodecahedron
    栁原悠人; 熊谷和博; Yuanzhao Yao; 山本隼大; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Energy resolution of Al-Bi metal using MCP detector
    澁谷宗平; Yuanzhao Yao; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Energy resolved secondary electron imaging of B-doped diamond films
    樋口　慶; Yuanzhao Yao; 熊谷和博; 宋 翰聞; 神田 久生; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Energy resolution of Al-Bi metal using MCP detector
    松石晃弥; 栁原悠人; Yuanzhao Yao; 高森　晋; 木村　隆; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Comparison of SE emission from alumina and SUS spheres using low vacuum SEM
    Yuanzhao Yao; 早田康成; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Development of thickness-controlled TEM sample preparation by FIB-SEM
    埋橋淳; 大久保忠勝; Yuanzhao Yao; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Development and Application of High Pass Electron Detector in Low Accelerated Voltage SE
    関口 隆史; Yuanzhao Yao
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Development and Application of High Pass Electron Detector in Low Accelerated Voltage SE
    栁原悠人; Yuanzhao Yao; 山本隼大; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Cathodoluminescence/EBIC study of semiconductor materials and their defects
    関口 隆史; Chen Jun
    分析電顕討論会/2024-12-05--2024-12-06
  • more...
Teaching
2025-04 -- 2025-06Quantum Mechanics IUniversity of Tsukuba.
2025-04 -- 2025-07Scanning Electron MicroscopeUniversity of Tsukuba.
2025-04 -- 2025-07Linear algebra AUniversity of Tsukuba.
2025-05 -- 2025-08Introductory Sciences in MeasurementsUniversity of Tsukuba.
2024-05 -- 2024-08Introductory Sciences in MeasurementsUniversity of Tsukuba.
2024-04 -- 2024-07Scanning Electron MicroscopeUniversity of Tsukuba.
2024-04 -- 2024-06Quantum Mechanics IUniversity of Tsukuba.
2024-04 -- 2024-07Linear algebra AUniversity of Tsukuba.
2023-10 -- 2024-02Research in Optical and Electrical Nanomaterials IAUniversity of Tsukuba.
2023-10 -- 2024-02Research in Optical and Electrical Nanomaterials IIAUniversity of Tsukuba.
more...
Talks
  • 電子の眼で見る我々の周囲のミクロ世界
    関口 隆史
    サイエンス・シニアサロン in Tsukuba/2024-09-12--2024-09-12
  • Observation of Bacillus subtilis using various detectors
    関口 隆史
    日本顕微鏡学会学術講演会/2021-06-14--2021-06-16
Professional activities
2020-06 -- 2022-05The Japanese Society of Microscopy評議員
University Management
2022-04 -- 2024-03ハラスメント相談員ハラスメント相談
2021-04 -- 2022-03理工学類総合政策室総合政策室員

(Last updated: 2025-08-07)