SEKIGUCHI Takashi

Affiliation
Institute of Pure and Applied Sciences
Official title
Specially Appointed Professor
Email
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Research keywords
Scanning Electron Microscopy, Semiconductor, Defects
Secondary Electron Detector
Degree
1996-03Dr. of ScienceTohoku Univ.
Academic societies
1988-04 -- (current)The Japan Society of Applied Physics
1998-04 -- (current)The Japanese Society of Microscopy
Honors & Awards
2017-06瀬藤賞（顕微鏡学会賞）Cathodoluminescence and EBIC Characterization of Semiconducting Materials
Articles
Conference, etc.
  • Secondary electron detectors for low vacuum SEM (comparison of UVD and ET detectors)
    Yuanzhao Yao; 園田涼輔; 早田康成; 関口 隆史
    72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
  • Development of High Pass Electron Detector for Low-energy Backscattered electron Detector in SEM
    栁原悠人; Yao Yuanzhao; 山本隼大; SEKIGUCHI Takashi
    Microscopy and Microanalysis 2025/2025-07-27--2025-07-31
  • Backscattered Electron Detector Using Microchannel Plate
    栁原悠人; Yuanzhao Yao; 関口 隆史
    72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
  • Physical Information in Low Energy Backscattered Electron Image
    関口 隆史; Yuanzhao Yao; 松石晃弥; 栁原悠人
    72nd JSAP Spring Meeting 2025/2025-03-14--2025-03-17
  • Development of SE/BSE detector arranged in a dodecahedron
    栁原悠人; 熊谷和博; Yuanzhao Yao; 山本隼大; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Energy resolution of Al-Bi metal using MCP detector
    澁谷宗平; Yuanzhao Yao; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Energy resolved secondary electron imaging of B-doped diamond films
    樋口　慶; Yuanzhao Yao; 熊谷和博; 宋 翰聞; 神田 久生; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Energy resolution of Al-Bi metal using MCP detector
    松石晃弥; 栁原悠人; Yuanzhao Yao; 高森　晋; 木村　隆; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Comparison of SE emission from alumina and SUS spheres using low vacuum SEM
    Yuanzhao Yao; 早田康成; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Development of thickness-controlled TEM sample preparation by FIB-SEM
    埋橋淳; 大久保忠勝; Yuanzhao Yao; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Development and Application of High Pass Electron Detector in Low Accelerated Voltage SE
    関口 隆史; Yuanzhao Yao
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Development and Application of High Pass Electron Detector in Low Accelerated Voltage SE
    栁原悠人; Yuanzhao Yao; 山本隼大; 関口 隆史
    81st Annual Meeting of the Japan Society of Microscopy/2025-06-09--2025-06-11
  • Cathodoluminescence/EBIC study of semiconductor materials and their defects
    関口 隆史; Chen Jun
    分析電顕討論会/2024-12-05--2024-12-06
  • Characteristics of backscattered electron images taken by MCP detector
    栁原悠人; Yuanzhao Yao; 関口 隆史
    80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
  • SEM observation of GaN hexagonal prism crystal using concentric fountain SE detector
    樋口　慶; Yuanzhao Yao; 関口 隆史; 熊谷和博
    80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
  • Anomalous backscattered electron emission from grain boundaries in multi element alloy
    松石晃弥; Yuanzhao Yao; 高森　晋; 木村　隆; 関口 隆史
    80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
  • Characteristics of secondary electron emission from insulators analyzed by Al2O3 sphere image
    Yuanzhao Yao; 早田康成; 関口 隆史
    80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
  • Characterization of secondary electron detector（UVD）in low vacuum SEM
    Yuanzhao Yao; 園田涼輔; 早田康成; 関口 隆史
    80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
  • Characteristics of various electron detectors in SEM and the image information
    関口 隆史
    80th Annual Meeting of the Japan Society of Microscopy/2024-06-03--2024-06-05
  • Characteristics of diagonal SE/BSE detection in SEM
    関口 隆史
    The 60th SASJ Meeting/2023-06-29--2023-06-30
  • Evaluation of the detection property of an angle selective fountain electron detector
    関口 隆史; 熊谷和博
    DRIP XIX (The 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors)/2022-08-29--2022-09-01
  • Cathodoluminescence study of 3C-SiC layer grown on 4H-SiC substrate
    Jun Chen; Sazawa Hiroyuki; Wei Yi; Sekigushi Takashi
    DRIP XIX (The 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors)/2022-08-29--2022-09-01
  • 線形代数とSEM／電子検出器のアクセプタンスについて
    関口 隆史
    第 60 回表面分析研究会/2023-06-29--2023-06-30
  • Microscopic world of low-vacuum SEM
    関口 隆史
    日本表面真空学会真空技術部会/2023-06-07--2023-06-07
  • Characterization of surface bumps in SiC using concentric fountain SE detector
    関口 隆史; 小川創馬; 熊谷和博
    日本顕微鏡学会第79回学術講演会/2023-06-26--2023-06-28
  • more...
Teaching
2024-05 -- 2024-08Introductory Sciences in MeasurementsUniversity of Tsukuba.
2024-04 -- 2024-07Scanning Electron MicroscopeUniversity of Tsukuba.
2024-04 -- 2024-06Quantum Mechanics IUniversity of Tsukuba.
2024-04 -- 2024-07Linear algebra AUniversity of Tsukuba.
2023-10 -- 2024-02Research in Optical and Electrical Nanomaterials IAUniversity of Tsukuba.
2023-10 -- 2024-02Research in Optical and Electrical Nanomaterials IIAUniversity of Tsukuba.
2023-04 -- 2023-08Research in Optical and Electrical Nanomaterials IIBUniversity of Tsukuba.
2023-10 -- 2024-02Seminar in Optical and Electrical Nanomaterials IIUniversity of Tsukuba.
2023-04 -- 2023-08Research in Optical and Electrical Nanomaterials IBUniversity of Tsukuba.
2023-04 -- 2023-08Research in Optical and Electrical Nanomaterials IIAUniversity of Tsukuba.
more...
Talks
  • 電子の眼で見る我々の周囲のミクロ世界
    関口 隆史
    サイエンス・シニアサロン in Tsukuba/2024-09-12--2024-09-12
  • Observation of Bacillus subtilis using various detectors
    関口 隆史
    日本顕微鏡学会学術講演会/2021-06-14--2021-06-16
Professional activities
2020-06 -- 2022-05The Japanese Society of Microscopy評議員
University Management
2022-04 -- 2024-03ハラスメント相談員ハラスメント相談
2021-04 -- 2022-03理工学類総合政策室総合政策室員

(Last updated: 2025-08-07)