SEKIGUCHI Takashi

Affiliation
Institute of Pure and Applied Sciences
Official title
Professor
Email
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Research keywords
Scanning Electron Microscopy, Semiconductor, Defects
Secondary Electron Detector
Degree
1996-03Dr. of ScienceTohoku Univ.
Academic societies
1988-04 -- (current)The Japan Society of Applied Physics
1998-04 -- (current)The Japanese Society of Microscopy
Honors & Awards
2017-06瀬藤賞（顕微鏡学会賞）Cathodoluminescence and EBIC Characterization of Semiconducting Materials
Articles
Conference, etc.
  • Characteristics of diagonal SE/BSE detection in SEM
    関口 隆史
    The 60th SASJ Meeting/2023-06-29--2023-06-30
  • Evaluation of the detection property of an angle selective fountain electron detector
    関口 隆史; 熊谷和博
    DRIP XIX (The 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors)/2022-08-29--2022-09-01
  • Cathodoluminescence study of 3C-SiC layer grown on 4H-SiC substrate
    Jun Chen; Sazawa Hiroyuki; Wei Yi; Sekigushi Takashi
    DRIP XIX (The 19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors)/2022-08-29--2022-09-01
  • 線形代数とSEM／電子検出器のアクセプタンスについて
    関口 隆史
    第 60 回表面分析研究会/2023-06-29--2023-06-30
  • Microscopic world of low-vacuum SEM
    関口 隆史
    日本表面真空学会真空技術部会/2023-06-07--2023-06-07
  • Characterization of surface bumps in SiC using concentric fountain SE detector
    関口 隆史; 小川創馬; 熊谷和博
    日本顕微鏡学会第79回学術講演会/2023-06-26--2023-06-28
  • Characteristics of diagonal SE/BSE detection in SEM
    関口 隆史
    日本顕微鏡学会第79回学術講演会/2023-06-26--2023-06-28
  • Micellimaging using low-vacuum SEM
    関口 隆史
    日本顕微鏡学会学術講演会/2021-06-14--2021-06-16
  • Observation of Bacillus subtils using various detectors
    関口 隆史
    日本顕微鏡学会学術講演会/2021-06-14--2021-06-16
  • Relationship between charging phenomena and secondary electron emission in scanning electron microscopy
    関口 隆史
    日本顕微鏡学会学術講演会/2021-06-14--2021-06-16
  • Evaluation of the effect of sample charging about the reflected electron image - Halation
    関口 隆史
    日本顕微鏡学会学術講演会/2021-06-14--2021-06-16
  • Energy and Direction Resolved Secondary Electron Imaging Using Fountain Detector
    Sekigushi Takashi
    International Symposium on Practical Surface Analysis (PSA-19)/2019-11-08
  • Low Vacuum Scanning Electron Microscopy for Widegap Semiconductors and Insulating Materials
    Sekigushi Takashi
    International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)/2019-09-08--2019-09-12
  • GaPにおけるコヒーレントフォノンのGa+集束イオンビーム照射効果
    市川 卓人; 関口隆史; 齊藤 雄太; 長谷 宗明
    第６７回応用物理学会春季学術講演会/2020-03-12--2020-03-15
  • Secondary electron spectroscopy for imaging semiconductor materials
    Agemura Toshihide; Sekiguchi Takashi
    International Symposium on Semiconductor Manufacturing (ISSM)/2018-12-10--2018-12-11
Teaching
2024-05 -- 2024-08Introductory Sciences in MeasurementsUniversity of Tsukuba.
2024-04 -- 2024-07Scanning Electron MicroscopeUniversity of Tsukuba.
2024-04 -- 2024-06Quantum Mechanics IUniversity of Tsukuba.
2024-04 -- 2024-07Linear algebra AUniversity of Tsukuba.
2023-10 -- 2024-02Research in Optical and Electrical Nanomaterials IAUniversity of Tsukuba.
2023-10 -- 2024-02Research in Optical and Electrical Nanomaterials IIAUniversity of Tsukuba.
2023-04 -- 2023-08Research in Optical and Electrical Nanomaterials IIBUniversity of Tsukuba.
2023-10 -- 2024-02Seminar in Optical and Electrical Nanomaterials IIUniversity of Tsukuba.
2023-04 -- 2023-08Research in Optical and Electrical Nanomaterials IBUniversity of Tsukuba.
2023-04 -- 2023-08Research in Optical and Electrical Nanomaterials IIAUniversity of Tsukuba.
more...
Talks
  • Observation of Bacillus subtilis using various detectors
    関口 隆史
    日本顕微鏡学会学術講演会/2021-06-14--2021-06-16
Professional activities
2020-06 -- 2022-05The Japanese Society of Microscopy評議員
University Management
2022-04 -- 2024-03ハラスメント相談員ハラスメント相談
2021-04 -- 2022-03理工学類総合政策室総合政策室員

(Last updated: 2024-08-02)