UEDONO Akira

Researcher's full information

Articles
  • Observation of void-defects generation at SiC/Si interface by positron annihilation technique
    渡辺 匡人; 市橋 鋭也; 上殿 明良; 谷川 庄一郎
    Journal of the Japanese Association of Crystal Growth/27(1)/p.46, 2000-07
  • Analysing charge state of defects in electron-irradiated natural diamond probed by positron annihilation
    生形 友宏; 上殿 明良; 森下 憲雄; 伊藤 久義; 藤井 知; 鹿田 真一; 谷川 庄一郎
    Meeting abstracts of the Physical Society of Japan/55(2)/p.837, 2000-09
  • Oxygen-Related Defects Introduced by As^+-Implantation through Cap Layers in Si Probed by Monoenergetic Positron Beams
    村松 誠; 上殿 明良; 生形 友宏; 谷野 浩敏; 中野 明彦; 山本 秀和; 鈴木 良一; 大平 俊行; 谷川...
    Meeting abstracts of the Physical Society of Japan/55(2)/p.858, 2000-09
  • 低速陽電子によるP注入SiCの欠陥検出と焼鈍特性の研究 (「陽電子ビームの形成と理工学への応用」専門研究会報告書 平成12年度)
    上殿 明良; 谷川 庄一郎; 大島 武
    KURRI-KR/(63)/pp.113-118, 2000-11
  • A study of vacancy-type defects introduced by the carbonization of Si by monoenergetic positron beams
    上殿 明良; 村松 誠; 生形 友宏; 渡辺 匡人; 市橋 鋭也; 鈴木 良一; 大平 俊行; 三角 智久; 高須...
    Meeting abstracts of the Physical Society of Japan/56(1)/p.845, 2001-03
  • 陽電子消滅によるSrTiO3およびBaTiO3の酸素欠陥の研究 (「陽電子ビームの形成と理工学への応用」専門研究会報告書 平成14年度)
    上殿 明良; 下山 和男; 清原 正寛
    KURRI-KR/(89)/pp.155-160, 2002-11
  • 研究紹介 陽電子による先端半導体材料の評価
    上殿 明良; 鈴木 良一; 大平 俊行
    応用物理/74(9)/pp.1223-1226, 2005-09
  • In-situ characterization of free-volume holes in polymer thin films under controlled humidity conditions with an atmospheric positron probe microanalyzer
    Zhou Wei; Chen Zhe; Oshima Nagayasu; Ito Kenji; O'Rourke ...
    APPLIED PHYSICS LETTERS/101(1), 2012-07
  • Variation of Chemical Vapor Deposited SiO2 Density Due to Generation and Shrinkage of Open Space During Thermal Annealing
    Sometani Mitsuru; Hasunuma Ryu; Ogino Masaaki; Kuribayash...
    JAPANESE JOURNAL OF APPLIED PHYSICS/51(2)/pp.21101-021101-3, 2012-02
  • 21aJA-12 Development of a method for evaluating pores of samples mounted in air
    大島 永康; オローク ブライアン; 黒田 隆之助; 鈴木 良一; 伊藤 賢志; 柳下 宏; 天神林 和樹; 箇井...
    Meeting abstracts of the Physical Society of Japan/66(2)/p.971, 2011-08
  • 27pTN-4 Development of a method for guiding slow positron beam into air through a vacuum window
    大島 永康; オローク ブライアン; 黒田 隆之助; 鈴木 良一; 渡邉 宏理; 窪田 翔二; 天神林 和樹; 上...
    Meeting abstracts of the Physical Society of Japan/66(1)/p.985, 2011-03
  • Slow Positron Beam Apparatus for Surface and Subsurface Analysis of Samples in Air
    OSHIMA Nagayasu; O'ROURKE Brian E.; KURODA Ryunosuke; SUZ...
    Applied physics express/4(6)/pp.66701-1, 2011-06
  • Collateral evidence for an excellent radiative performance of AlxGa1-xN alloy films of high AlN mole fractions
    Chichibu S. F.; Hazu K.; Onuma T.; Uedono A.
    APPLIED PHYSICS LETTERS/99(5), 2011-08
  • Positron Annihilation Study on Defects in HfSiON Films Deposited by Electron-Beam Evaporation
    Yuan Guoliang; Lu Xubing; Ishiwara Hiroshi; Uedono Akira
    Jpn J Appl Phys/48(11)/pp.111404-111404-4, 2009-11
  • Vacancy-Boron Complexes in Plasma Immersion Ion-Implanted Si Probed by a Monoenergetic Positron Beam
    Uedono Akira; Tsutsui Kazuo; Ishibashi Shoji; Hiromichi ...
    Jpn J Appl Phys/49(5)/pp.51301-051301-6, 2010-05
  • Investigating the binding properties of porous drug delivery systems using nuclear sensors (radiotracers) and positron annihilation lifetime spectroscopy-Predicting conditions for optimum performance
    Mume Eskender; Lynch Daniel E.; Uedono Akira; Smith Suza...
    DALTON TRANSACTIONS/40(23)/pp.6278-6288, 2011-01
  • Slow Positron Beam Apparatus for Surface and Subsurface Analysis of Samples in Air
    Oshima Nagayasu; O'Rourke Brian E.; Kuroda Ryunosuke; Suz...
    APPLIED PHYSICS EXPRESS/4(6)/pp.0-0, 2011-06
  • Structure-Modification Model of Porogen-Based Porous SiOC Film with Ultraviolet Curing
    Oka Yoshihiro; Uedono Akira; Goto Kinya; Hirose Yukinori...
    JAPANESE JOURNAL OF APPLIED PHYSICS/50(5:Part 2 Sp. Iss. SI)/pp.05EB06-05EB06-5, 2011-05
  • Impact of Cu/III ratio on the near-surface defects in polycrystalline CuGaSe2 thin films
    Islam M. M.; Uedono A.; Ishibashi S.; Tenjinbayashi K.; S...
    APPLIED PHYSICS LETTERS/98(11)/pp.0-0, 2011-03
  • Material Selection for the Metal Gate/High-k Transistors
    AKASAKA Y.; MIYAGAWA K.; KARIYA A.; SHOJI H.; AOYAMA T.; ...
    Extended abstracts of the ... Conference on Solid State Devices and Materials/2004(0)/pp.196-197, 2004-09
  • 26pYS-5Positronium emission from solid surface measured by time of flight method
    栗原 俊一; 上殿 明良; 池田 光男; 榎本 収志; 大越 隆夫; 大澤 哲; 小川 雄二郎; 柿原 和久; 設...
    Meeting abstracts of the Physical Society of Japan/60(1)/p.926, 2005-03
  • Characterization of Open Spaces in High-κ Materials by Monoenergetic Positron Beams
    上殿 明良; 後藤 正和; 樋口 恵一; 池内 恒平; ABUDUL Hamid Alaa Salah; 山部 ...
    Journal of the Surface Science Society of Japan/26(5)/pp.268-273, 2005-05
  • Characterization of Open Volumes in High-k Gate Dielectrics by Using Monoenergetic Positron Beams
    上殿 明良; 大塚 崇; 伊東 健一; 白石 賢二; 山部 紀久夫; 宮崎 誠一; 梅澤 直人; 知京 豊裕; 大...
    Technical report of IEICE. SDM/106(108)/pp.25-30, 2006-06
  • Local Bonding Structure of High-Stress Silicon Nitride Film modified by UV Curing for Strained-Silicon Technology beyond 45nm Node SoC Devices
    MIYAGAWA Yoshihiro; MURATA Tatsunori; NISHIDA Yukio; NAKA...
    Extended abstracts of the ... Conference on Solid State Devices and Materials/2006(0)/pp.158-159, 2006-09
  • Mechanism of Threshold Voltage Reduction and Hole Mobility Enhancement in pMOSFETs Employing Sub-1nm EOT HfSiON by Use of Substrate Fluorine Ion Implantation
    INUMIYA Seiji; UEDONO Akira; MIYAZAKI Seiichi; OHTSUKA S...
    Extended abstracts of the ... Conference on Solid State Devices and Materials/2006(0)/pp.394-395, 2006-09
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