吉田 昭二(ヨシダ ショウジ)

研究者情報全体を表示

論文

• STMを用いたWS₂/Mo_1-xW_xS₂単層ヘテロ接合バンドアライメントの2次元イメージング
  吉田 昭二; 櫻田 龍司; 小林 祐; 茂木 裕幸; 武内 修; 宮田 耕充; 重川 秀実
  表面科学学術講演会要旨集/35(0)/p.317, 2015
  
  CiNii
• Mo1-xWxS2合金からなる単層ヘテロ構造のSTM観察と面内組成解析
  茂木 裕幸; 吉田 昭二; 小林 佑; 宮田 耕充; 甲山 智規; 武内 修; 重川 秀実
  表面科学学術講演会要旨集/35(0)/p.29, 2015
  
  CiNii
• CDW-MH相転移を示す新規Br架橋Pd錯体[Pd(cptn)_2Br]Br_2の電子状態
  高石 慎也; 吉田 健文; 山下 正廣; 岡本 博; 田中 久暁; 黒田 新一; 細見 由香; 吉田...
  日本物理学会講演概要集/70(2)/p.1577, 2015-09
  
  CiNii
• Nanoscale probe of transient carrier dynamics modulated in GaAs-PIN junction by laser-combined scanning tunneling microscopy
  吉田 昭二; 武内 修; 重川 秀実
  Nanoscale/4(3)/p.757-761, 2012
• ナノスケールポンププローブイメージング法で観る半導体キャリアダイナミックス
  吉田 昭二; 武内 修; 重川 秀実
  レーザー研究/40(8)/pp.564-570, 2012-08
  
  CiNii
• Direct Probing of Transient Photocurrent Dynamics in p-WSe2 by Time-Resolved Scanning Tunneling Microscopy
  Yoshida Shoji; Terada Yasuhiko; Yokota Munenori; Takeuchi...
  APPLIED PHYSICS EXPRESS/6(1), 2013-01
  
  CiNii
• Single-Atomic-Level Probe of Transient Carrier Dynamics by Laser-Combined Scanning Tunneling Microscopy
  Yoshida Shoji; Yokota Munenori; Takeuchi Osamu; Oigawa H...
  APPLIED PHYSICS EXPRESS/6(3), 2013-03
  
  CiNii
• Pseudo-Real Time Observation of the Dynamics of Phase Defect on Si(100) Surface
  YOSHIDA Shoji; TAKEUCHI Osamu; HATA Kenji; MORITA Ryuji; ...
  Japanese journal of applied physics. Pt. 1, Regular papers & short notes/41(7)/pp.5017-5020, 2002-07
  
  CiNii
• フェムト秒時間分解走査プローブ顕微鏡技術の開発
  吉田 昭二; 武内 修; 重川 秀実
  顕微鏡 = Microscopy/47(1)/pp.8-13, 2012-03
  
  CiNii
• 光励起STMと局所分光 : 光変調トンネル分光法による局所バンド構造解析とキャリアダイナミクス計測
  吉田 昭二; 蟹谷 裕也; 武内 修; 重川 秀実
  表面科学 = Journal of The Surface Science Society of Japan/28(2)/pp.111-114, 2007-02
  
  CiNii
• フェムト秒時間分解走査トンネル顕微鏡が開く扉 : 時間分解トンネル電流で覗く世界
  寺田 康彦; 吉田 昭二; 武内 修; 重川 秀実
  真空/51(12)/pp.801-806, 2008-12
  
  CiNii
• Anisotropic free-electron-like dispersions and standing waves realized in self-assembled monolayers of glycine on Cu(100)
  Kanazawa Ken; Sainoo Yasuyuki; Konishi Yasuaki; Yoshida ...
  JOURNAL OF THE AMERICAN CHEMICAL SOCIETY/129(4)/pp.740-741, 2007-01
• Microscopic basis for the mechanism of carrier dynamics in an operating p-n junction examined by using light-modulated scanning tunneling spectroscopy
  Yoshida Shoji; Kanitani Yuya; Oshima Ryuji; Okada Yoshit...
  PHYSICAL REVIEW LETTERS/98(2)/pp.0-0, 2007-01
• Reversible defect engineering of single-walled carbon nanotubes using scanning tunneling microscopy
  Berthe Maxime; Yoshida Shoji; Ebine Yuta; Kanazawa Ken; O...
  NANO LETTERS/7(12)/pp.3623-3627, 2007-12
• Probing nanoscale potential modulation by defect-induced gap states on GaAs(110) with light-modulated scanning tunneling spectroscopy
  Yoshida Shoji; Kanitani Yuya; Takeuchi Osamu; Shigekawa ...
  APPLIED PHYSICS LETTERS/92(10)/pp.0-0, 2008-03
• Optical Doping: Active Control of Metal-insulator Transition in Nanowire
  Terada Yasuhiko; Yoshida Shoji; Okubo Atsushi; Kanazawa ...
  NANO LETTERS/8(11)/pp.3577-3581, 2008-11
  
  PubMed
• Self-organization of In nanostructures on Si surfaces
  Xu Maojie; Okada Arifumi; Yoshida Shoji; Shigekawa Hidemi
  APPLIED PHYSICS LETTERS/94(7)/pp.0-0, 2009-02
• Light-modulated scanning tunneling spectroscopy for nanoscale imaging of surface photovoltage
  Takeuchi O; Yoshida S; Shigekawa H
  APPLIED PHYSICS LETTERS/84(18)/pp.3645-3647, 2004-05
• Temperature effect as an essential factor in scanning tunneling microscopy studies demonstrated by the analysis of an oxygen-adsorbed Si(111)-7x7 surface
  Konishi Y; Yoshida S; Sainoo Y; Takeuchi O; Shigekawa H
  PHYSICAL REVIEW B/70(16)/pp.0-0, 2004-10
• Probe effect in scanning tunneling microscopy on Si(001) low-temperature phases
  Yoshida S; Kimura T; Takeuchi O; Hata K; Oigawa H; Nagamu...
  PHYSICAL REVIEW B/70(23)/pp.0-0, 2004-12
• Tunneling spectroscopy and manipulation of a single C2H2 molecule on a Cu(111) surface
  Konishi Y; Sainoo Y; Kanazawa K; Yoshida S; Taninaka A; T...
  PHYSICAL REVIEW B/71(19)/pp.0-0, 2005-05
• Bond fluctuation of S/Se anchoring observed in single-molecule conductance measurements using the point contact method with scanning tunneling microscopy
  Yasuda Satoshi; Yoshida Shoji; Sasaki Jiro; Okutsu Yoshi...
  JOURNAL OF THE AMERICAN CHEMICAL SOCIETY/128(24)/pp.7746-7747, 2006-06